High-speed Fizeau interferometry for film topography measurement during spray film interaction

S.l.] / American Institute of Physics (2018) [Journal Article]

Review of scientific instruments
Volume: 89
Issue: 11
Page(s): 113703

Authors

Selected Authors

Schumacher, Leif
Seel, Kevin
Reddemann, Manuel Armin
Kneer, Reinhold

Identifier